基于多信號(hào)流圖模型的診斷策略優(yōu)化技術(shù)研究
本文選題:可測(cè)試性設(shè)計(jì) + 多信號(hào)流圖 ; 參考:《鄭州大學(xué)》2015年碩士論文
【摘要】:隨著高新技術(shù)的迅速發(fā)展,電子設(shè)備的結(jié)構(gòu)和技術(shù)越來越復(fù)雜,給測(cè)試、診斷和維修帶來了更大的挑戰(zhàn)。可測(cè)性設(shè)計(jì)作為提高設(shè)備的可用度,減少系統(tǒng)全壽命費(fèi)用的重要技術(shù),日益受到人們的關(guān)注。基于多信號(hào)流圖模型的可測(cè)性分析是目前比較有效的一種可測(cè)性設(shè)計(jì)方法,診斷策略優(yōu)化設(shè)計(jì)作為其中的一項(xiàng)重要內(nèi)容,在減少系統(tǒng)的故障診斷時(shí)間、維修人力、維修器材和保障費(fèi)用,提高系統(tǒng)的戰(zhàn)備完好性等方面具有重要的意義。診斷策略優(yōu)化問題也就是故障檢測(cè)和隔離時(shí)測(cè)試排序問題,其目的是要構(gòu)建一種測(cè)試序列,以較小的測(cè)試代價(jià)快速的隔離系統(tǒng)故障狀態(tài)。對(duì)此,國內(nèi)外學(xué)者進(jìn)行了大量的研究,在二值測(cè)試方面,已取得不少研究成果,但在多值測(cè)試方面還缺乏深入研究。本文針對(duì)二值測(cè)試的經(jīng)典算法的不足做出了改進(jìn),并對(duì)多值測(cè)試的問題進(jìn)行了研究。本文首先介紹了多信號(hào)流圖的建模過程,根據(jù)電子設(shè)備的原理圖,建立多信號(hào)流圖模型,得到診斷策略優(yōu)化設(shè)計(jì)需要的故障-測(cè)試依存矩陣。其次介紹了診斷策略優(yōu)化技術(shù)的基本理論,并對(duì)二值測(cè)試的診斷策略優(yōu)化設(shè)計(jì)問題進(jìn)行研究,分析了二值測(cè)試下經(jīng)典診斷策略優(yōu)化算法(貪婪算法和AO*算法)的優(yōu)劣,提出有限搜索AO*算法,通過實(shí)例仿真驗(yàn)證了改進(jìn)的算法在診斷樹的最優(yōu)性和算法的效率上更有優(yōu)勢(shì)。然后,在此基礎(chǔ)上,對(duì)多值測(cè)試的診斷策略優(yōu)化設(shè)計(jì)問題進(jìn)行研究,提出了基于霍夫曼編碼的與或樹啟發(fā)式搜索算法,通過實(shí)例仿真驗(yàn)證了該算法在解決多值測(cè)試診斷策略優(yōu)化問題上是可行的。最后,根據(jù)診斷策略優(yōu)化算法的輸入和輸出要求,設(shè)計(jì)了可用于小型系統(tǒng)的圖形界面,通過圖形界面使操作更簡(jiǎn)單,輸出結(jié)果更直觀。
[Abstract]:With the rapid development of high and new technology, the structure and technology of electronic equipment are becoming more and more complex, which brings more challenges to testing, diagnosis and maintenance. Testability design, as an important technology to improve the availability of equipment and reduce the life cost of the system, has attracted more and more attention. The testability analysis based on multi-signal flow graph model is an effective design method for testability at present. The optimal design of diagnosis strategy is one of the important contents, which can reduce the time of fault diagnosis and maintain manpower. It is of great significance to maintain the equipment and support cost and improve the combat readiness of the system. The problem of diagnosis strategy optimization is called the problem of fault detection and test sequencing when isolation. The purpose of this problem is to construct a kind of test sequence to isolate the fault state of the system quickly with less test cost. A lot of research has been done by scholars at home and abroad, and a lot of research results have been made in the field of binary testing, but there is still a lack of further research in the field of multi-value testing. In this paper, the shortcomings of classical algorithms for binary testing are improved, and the problem of multivalued testing is studied. In this paper, the modeling process of multi-signal flow graph is first introduced. According to the schematic diagram of electronic equipment, the multi-signal flow graph model is established, and the fail-test dependency matrix for the optimal design of diagnosis strategy is obtained. Secondly, the basic theory of diagnostic strategy optimization technology is introduced, and the optimal design of diagnostic strategy for binary testing is studied, and the advantages and disadvantages of classical diagnostic strategy optimization algorithms (greedy algorithm and AO* algorithm) under binary test are analyzed. A finite search AO* algorithm is proposed. The simulation results show that the improved algorithm has more advantages in the optimality of the diagnostic tree and the efficiency of the algorithm. Then, on this basis, the optimal design of diagnosis strategy for multi-valued testing is studied, and a heuristic search algorithm based on Huffman coding and OR tree is proposed. The simulation results show that the algorithm is feasible in solving the problem of multi-value test and diagnosis strategy optimization. Finally, according to the input and output requirements of the diagnostic strategy optimization algorithm, a graphical interface is designed, which can be used in a small system. The operation is simpler and the output result is more intuitive through the graphical interface.
【學(xué)位授予單位】:鄭州大學(xué)
【學(xué)位級(jí)別】:碩士
【學(xué)位授予年份】:2015
【分類號(hào)】:TN06
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