本文選題：PNP三極管 + NPN三極管　； 參考：《蘭州交通大學(xué)》2015年碩士論文

【摘要】：功率半導(dǎo)體器件是電子技術(shù)的主要組成部分。自1956年晶閘管發(fā)明以來,制造生產(chǎn)出大量的半導(dǎo)體器件。功率半導(dǎo)體器件在日常生活中應(yīng)用十分廣泛,是電子設(shè)備中的必要元件。目前,在電子工業(yè)中主要的半導(dǎo)體器件有BJT、MOSFET、IGBT以及IGCT,主要應(yīng)用于高壓、快速切換、高頻等。相對(duì)于硅材料,碳化硅材料使得半導(dǎo)體器件的性能得到較大提高。半導(dǎo)體器件是每個(gè)電子設(shè)備不可或缺的部分,大部分電子設(shè)備的異常是由半導(dǎo)體器件的損壞或者其他原因造成的。如果是半導(dǎo)體器件的原因,則需要對(duì)其進(jìn)行更換。由于電子設(shè)備種類繁多,如果知道半導(dǎo)體器件的型號(hào),則容易進(jìn)行更換,如果沒有半導(dǎo)體器件的任何數(shù)據(jù),則難于更換�；谶@一問題,設(shè)計(jì)了一種半導(dǎo)體測試設(shè)備。本文使用兩個(gè)開關(guān)對(duì)半導(dǎo)體器件進(jìn)行測量:一個(gè)開關(guān)被用于分離微控制器的上拉電阻。我們可以關(guān)閉所述銷的使用另一個(gè)開關(guān)的輸出。輸出取決于另一個(gè)開關(guān),也可用于控制上拉電阻。這兩個(gè)開關(guān)的狀態(tài)不能在同一時(shí)間工作,會(huì)交替處于工作狀態(tài)。所述半導(dǎo)體器件的三個(gè)測試終端具有三個(gè)引腳的微控制器中的一個(gè)連接。每個(gè)檢測終端的狀態(tài)可以改變?yōu)檩敵?并以同樣的方式將其與電源以及接地端連接。以另一種方式,它們與680K、470K或通過地面、電源連接,此方法被用于正引腳。同一標(biāo)準(zhǔn)用于測試終端的負(fù)狀態(tài)。第三端子銷也被稱為測試引腳,可以是開放式或連接在同一正、負(fù)引腳上.它由兩部分組成:硬件部分和軟件部分。在硬件部分,我們?cè)O(shè)計(jì)了一塊PCB板。選用Altium Designer軟件設(shè)計(jì)電路圖和PCB.首先,論文中所畫示意圖為本次課題的研究項(xiàng)目,并確認(rèn)了所有的模擬連接,完成所有連接后進(jìn)行PCB設(shè)計(jì)。在PCB設(shè)計(jì)中,在不影響其它部件連接方式的基礎(chǔ)上,并避免熱、電磁的影響,在項(xiàng)目中采用16×2液晶顯示器。液晶屏被用于applications.LCD等電子設(shè)備中,不但經(jīng)濟(jì)且易于編程、顯示動(dòng)畫等。16×2的液晶屏可以每行顯示16個(gè)字符,并可雙行顯示。在兩行中,每個(gè)字符是由5x7像素矩陣組成。論文中設(shè)計(jì)了大量的電路圖和PCB庫。市場上有各種微處理器,我們選用低功耗的MSP430F132,它有混合信號(hào)處理能力、16位處理器、16位地址和數(shù)據(jù)總線;32KHz CPU、多種外設(shè)由于DCO快速重啟功能等。該設(shè)備可由9V電池運(yùn)行。論文中使用了兩個(gè)電壓調(diào)節(jié)器。由于除MSP430,所有部件需要在5V電壓下工作,因此其中一個(gè)調(diào)節(jié)器(LM7805)用于將9V電壓轉(zhuǎn)換為5V;另一個(gè)調(diào)節(jié)器(AM1117)被用于將5V電壓轉(zhuǎn)換為3V。MSP430的工作電壓超過3V時(shí)會(huì)損壞。焊接工作是在實(shí)驗(yàn)室完成的,PCB的大小為800mmX500mm,硬件的詳細(xì)信息見后面章節(jié)。在軟件部分,主要是對(duì)MCU的編程和調(diào)試。以IAR Embedded Workbench為開發(fā)環(huán)境,采用C語言編程,使用MSP-FET430UIF作為PC接口,其仿真功能強(qiáng)大,可以快速啟動(dòng)MSP430微控制器并應(yīng)用于程序的開發(fā)。軟件中的USB調(diào)試工具被用于MSP430的編程,其調(diào)試系統(tǒng)具有JTAG接口、間諜碧-Wire協(xié)議的輔助,通過它可以抹去閃存和程序新代碼。由于MSP430的兼容性問題,不能使用USB接口。在這兩部分內(nèi)容完成之后,我們進(jìn)行了一些功能性測試以保證PCB板沒有任何問題.這些測試包括I/O功能的測試、振蕩器測試和外設(shè)測試。對(duì)于I/O功能的測試,我們通過發(fā)送一些簡單的代碼檢查所有的引腳。這一系列的測試是檢查所有引腳的連接性,并確保在PCB板上的兩個(gè)或更多的引腳之間沒有交叉連接。在振蕩器測試中,代碼的寫入用于啟用和禁用外部晶體振蕩器的使用。在外圍測試中,代碼用于激活設(shè)備以及測試。這些代碼來自于MSP430的代碼示例。經(jīng)過測試后該板可以進(jìn)行測量了。它可以自動(dòng)識(shí)別NPN和PNP晶體管、計(jì)算電流放大系數(shù)和基極-發(fā)射極電壓閾值并將其顯示于LCD顯示屏。采用同樣的方式,它還可以識(shí)別N型和P型MOSFET,計(jì)算柵閾值電壓和柵容量。關(guān)斷電流約為20nA。
[Abstract]:Power semiconductor devices are the main components of electronic technology. Since the invention of the thyristor in 1956, a large number of semiconductor devices have been produced and produced. Power semiconductor devices are widely used in daily life and are essential components in electronic devices. At present, the main semiconductor devices in the electronic industry are BJT, MOSFET, IGBT and IGCT. It is mainly used in high voltage, fast switching, high frequency and so on. Relative to silicon material, silicon carbide materials make the performance of semiconductor devices greatly improved. Semiconductor devices are an indispensable part of every electronic device. Most of the electronic devices are caused by the damage of semiconductor devices or other reasons. Because of the wide variety of electronic devices, if the type of semiconductor device is known, it is easy to replace. If there is no data of the semiconductor device, it is difficult to replace. Based on this problem, a semiconductor testing device is designed. This paper uses two switches to measure semiconductor devices. A switch is used to separate the pull resistance of the microcontroller. We can close the output of the use of the other switch of the pin. The output depends on another switch and can be used to control the pull resistance. The state of the two switches can not work at the same time and will be in the working state alternately. The three test end of the semiconductor device is final. A connection in a microcontroller with three pins. The state of each detection terminal can be changed to output and connected to the power supply and the ground end in the same way. In another way, they are connected to the 680K, 470K, or through the ground, and the method is used by the Yu Zheng pin. The same standard is used to test the negative state of the terminal. The third terminal pin is also called the test pin, which can be open or connected to the same positive and negative pins. It consists of two parts: hardware and software parts. In the hardware part, we have designed a PCB board. Altium Designer software is used to design the circuit diagram and PCB. first, the drawings in this paper are the research projects of this subject, In the design of PCB, 16 x 2 liquid crystal displays are used in the project, and the LCD screen is used in applications.LCD isoelectric devices. It is not only economical and easy to program, but also is easy to program and display animation. The.16 * 2 LCD screen can display 16 characters per line and double line display. In the two line, each character is made up of a 5x7 pixel matrix. A large number of circuit diagrams and PCB libraries are designed in this paper. There are various microprocessors in the market. We choose low power MSP430F132, it has mixed signal processing capability, 16 bit processor, 16 bit address and number. According to the bus; 32KHz CPU, a variety of peripherals can be run by the DCO fast restart function. The device can be run by a 9V battery. In this paper, two voltage regulators are used. Because except MSP430, all parts need to work under the 5V voltage, so one of the regulators (LM7805) is used to convert the 9V voltage to 5V; the other regulator (AM1117) is used for 5V voltage. The work voltage conversion to 3V.MSP430 is damaged when the voltage exceeds 3V. The welding work is done in the laboratory, the size of the PCB is 800mmX500mm, the details of the hardware are seen in the following section. In the software part, the programming and debugging of the MCU is mainly used. IAR Embedded Workbench is used as the development environment, the C language programming is used, and MSP-FET430UIF is used as PC interface. It has powerful simulation function and can quickly start the MSP430 micro controller and apply it to program development. The USB debugging tool in the software is used in MSP430 programming. The debugging system has the JTAG interface and the assistant of the spy blue -Wire protocol. Through it, the flash memory and the new code of the program can be erased. Because of the compatibility problem of MSP430, the USB interface can not be used. After the completion of these two parts, we have done some functional tests to ensure that there are no problems with the PCB board. These tests include the I/O function test, the oscillator test and the peripherals test. For the I/O function test, we check all pins by sending some simple code. This series of tests is to check all the references. The connectivity of the foot, and ensures no cross connection between two or more pins on the PCB board. In the oscillator test, the code is written to enable and disable the use of the external crystal oscillator. In the peripheral test, the code is used to activate the device and test. The code comes from the code example of the MSP430. After the test, the plate is tested. It can be measured. It can automatically identify the NPN and PNP transistors, calculate the current amplification factor and the base emitter voltage threshold and display it on the LCD display. In the same way, it can also identify the N and P MOSFET, calculate the gate threshold voltage and gate capacity. The shut off flow is about 20nA..

【學(xué)位授予單位】：蘭州交通大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2015
【分類號(hào)】：TN303

【共引文獻(xiàn)】

相關(guān)期刊論文 前1條

1 鄧永輝;謝剛;汪濤;盛況;;A novel 4H-SiC lateral bipolar junction transistor structure with high voltage and high current gain[J];Chinese Physics B;2013年09期

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本文編號(hào)：1787684