基于目標(biāo)輪廓幾何特征的電容元件定位方法
發(fā)布時(shí)間:2018-03-08 02:15
本文選題:電容元件 切入點(diǎn):角點(diǎn)檢測(cè) 出處:《計(jì)算機(jī)工程與科學(xué)》2017年08期 論文類型:期刊論文
【摘要】:隨著印刷電路板(PCB)生產(chǎn)工藝愈加復(fù)雜,電容元件的定位識(shí)別難度也隨之增加。在實(shí)際生產(chǎn)中,為了節(jié)約成本、減少出錯(cuò)率,需要在焊接之前對(duì)電路板進(jìn)行檢測(cè),同時(shí)為了固定電路板上元器件,一般會(huì)使用壓板固定電路板。針對(duì)此種情況,提出一種復(fù)雜背景下被遮蓋電容元件的定位方法,通過(guò)對(duì)采集到的PCB圖像進(jìn)行預(yù)處理、閾值分割、邊緣提取和Harris角點(diǎn)檢測(cè)等操作,進(jìn)而根據(jù)電容元件目標(biāo)輪廓的幾何特征對(duì)元件進(jìn)行定位。該方法已經(jīng)在實(shí)踐中得到應(yīng)用,定位準(zhǔn)確率高、速度快,能廣泛應(yīng)用于實(shí)際生產(chǎn)中。
[Abstract]:With the increasing complexity of PCB (printed Circuit Board) manufacturing process, the difficulty of locating and identifying capacitive components increases. In order to save cost and reduce error rate, the PCB needs to be tested before welding. At the same time, in order to fix the components on the circuit board, the pressure plate is usually used to fix the circuit board. In view of this situation, a location method of the covered capacitor element in the complex background is proposed, which can preprocess the collected PCB image and segment the threshold value. The edge detection and Harris corner detection are used to locate the components according to the geometric features of the target contour of the capacitors. This method has been applied in practice with high accuracy and high speed. It can be widely used in practical production.
【作者單位】: 中國(guó)礦業(yè)大學(xué)計(jì)算機(jī)學(xué)院;
【基金】:國(guó)家自然科學(xué)基金(51204185,51034005) 中國(guó)博士后科學(xué)基金面上項(xiàng)目(2012M521147) 國(guó)家重點(diǎn)基礎(chǔ)研究發(fā)展計(jì)劃(973計(jì)劃)(2013CB227900) 國(guó)家863計(jì)劃(2012AA062004) 江蘇省產(chǎn)學(xué)研項(xiàng)目(BY2013019-04)
【分類號(hào)】:TN41;TP391.41
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