本文關(guān)鍵詞：基于嵌入式系統(tǒng)的晶體管特性圖示儀設(shè)計(jì)　出處：《合肥工業(yè)大學(xué)》2016年碩士論文　論文類型：學(xué)位論文

  更多相關(guān)文章： 晶體管特性 STM32 階梯電流源 掃描電壓源 弱電流采樣

【摘要】：晶體管作為重要的電子元器件,既是整個(gè)電子行業(yè)的基礎(chǔ),同時(shí)也深刻地影響著行業(yè)的發(fā)展。晶體管特性圖示儀作為測(cè)量測(cè)試儀器,在晶體管的篩選使用過(guò)程中發(fā)揮著重要作用。傳統(tǒng)晶體管特性圖示儀是基于模擬電子線路的純硬件設(shè)備,缺少數(shù)字化接口,同時(shí)體積較大。隨著嵌入式系統(tǒng)的應(yīng)用以及微電子技術(shù)的發(fā)展,為晶體管特性圖示儀的數(shù)字化、網(wǎng)絡(luò)化和智能化發(fā)展提供了技術(shù)支撐,本文研究基于嵌入式處理器的晶體管特性圖示儀設(shè)計(jì)方法,能夠?qū)崿F(xiàn)相關(guān)參數(shù)的自動(dòng)測(cè)量、計(jì)算與顯示,為高校電子信息類相關(guān)專業(yè)提供信息化實(shí)驗(yàn)教學(xué)設(shè)備。本文簡(jiǎn)介晶體管特性圖示儀原理、單元電路組成及結(jié)構(gòu)特點(diǎn),基于嵌入式微控制器STM32F103設(shè)計(jì)了一種數(shù)字化的晶體管特性圖示儀。給出圖示儀硬件體系結(jié)構(gòu)設(shè)計(jì),整個(gè)系統(tǒng)包括微控制器單元模塊、信號(hào)發(fā)生電路模塊、信號(hào)采集和調(diào)理模塊以及顯示模塊,重點(diǎn)介紹信號(hào)發(fā)生電路和數(shù)據(jù)采集電路的設(shè)計(jì),其中信號(hào)發(fā)生電路由階梯電流源、階梯電壓源以及掃描電壓源三個(gè)部分組成,集電極弱電流信號(hào)(精密采樣電阻端電壓)通過(guò)儀表放大器放大處理后進(jìn)行采樣。軟件上基于Keil μ Vision集成開(kāi)發(fā)環(huán)境實(shí)現(xiàn)測(cè)量控制功能,微控制器單元通過(guò)SPI接口控制數(shù)字電位器接入電路的阻值而產(chǎn)生基極階梯電流信號(hào),通過(guò)DAC輸出可調(diào)模擬電壓產(chǎn)生集電極掃描電壓信號(hào),采用內(nèi)置12位逐次逼近型ADC進(jìn)行基極和集電極電壓采樣,采用中位值平均濾波算法對(duì)連續(xù)多次采樣值進(jìn)行運(yùn)算,提高測(cè)量精度,通過(guò)可變靜態(tài)存儲(chǔ)控制器總線驅(qū)動(dòng)LCD,對(duì)于待測(cè)晶體管輸入輸出特性曲線的顯示采用描點(diǎn)法實(shí)現(xiàn)。同時(shí),還基于Lab VIEW設(shè)計(jì)了上位機(jī)程序,通過(guò)網(wǎng)口向微控制器單元發(fā)送控制命令或者接收來(lái)自它的采樣數(shù)據(jù)并保存。本文最后給出各模塊測(cè)試數(shù)據(jù)及系統(tǒng)實(shí)驗(yàn)結(jié)果,結(jié)果表明設(shè)計(jì)的嵌入式晶體管特性圖示儀正常運(yùn)行,階梯電流源產(chǎn)生分辨率為0.1μA的0-160μA電流,掃描電壓源產(chǎn)生分辨率為8mV的0-30V電壓,通過(guò)與實(shí)驗(yàn)室現(xiàn)有圖示儀對(duì)比,其輸出特性測(cè)量誤差為0.24%,精度較高,同時(shí)該圖示儀體積小、成本低,對(duì)測(cè)試結(jié)果可以進(jìn)行數(shù)字化處理。
[Abstract]:As an important electronic device, transistor is not only the foundation of the whole electronic industry, but also has a profound impact on the development of the industry. Traditional transistor characteristic grapher is a pure hardware device based on analog electronic circuit and lacks digital interface. With the application of embedded system and the development of microelectronic technology, it provides technical support for the digitization, networking and intelligent development of transistor characteristic grapher. In this paper, the design method of transistor characteristic grapher based on embedded processor is studied, which can realize the automatic measurement, calculation and display of related parameters. This paper introduces the principle of transistor characteristic graph instrument, unit circuit composition and structure characteristics. Based on the embedded microcontroller STM32F103, a digital transistor characteristic grapher is designed, and the hardware architecture of the instrument is designed. The whole system includes the module of the microcontroller unit. Signal generation circuit module, signal acquisition and conditioning module and display module. The design of signal generation circuit and data acquisition circuit is introduced, in which the signal generation circuit is composed of step current source. The step voltage source and the scanning voltage source are composed of three parts. The collector weak current signal (precision sampling resistor terminal voltage) is amplified by the instrument amplifier and sampled. The software realizes the function of measurement and control based on Keil 渭 Vision integrated development environment. The microcontroller unit controls the resistance of the digital potentiometer access circuit through the SPI interface to generate the base step current signal, and the collector scan voltage signal is generated by the DAC output adjustable analog voltage. The embedded 12-bit successive approximation ADC is used to sample the base and collector voltage, and the median average filter algorithm is used to calculate the continuous multiple sampling values to improve the measurement accuracy. LCD is driven by variable static memory controller bus, and the display of input and output characteristic curve of transistors to be tested is realized by drawing point method. At the same time, the upper computer program is designed based on Lab VIEW. The control command is sent to the microcontroller unit through the network interface or the sampling data from it is received and saved. Finally, the test data of each module and the experimental results of the system are given. The results show that the embedded transistor characteristic grapher works normally, and the step current source generates 0-160 渭 A current with a resolution of 0.1 渭 A. The scanning voltage source produces 0-30V voltage with a resolution of 8mV. By comparing with the existing graphical instrument in the laboratory, the measuring error of the output characteristic is 0.24, the accuracy is high, and the volume of the instrument is small. Low cost, the test results can be digitally processed.
【學(xué)位授予單位】：合肥工業(yè)大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2016
【分類號(hào)】：TN32

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