本文關(guān)鍵詞：高速大電流脈沖式LIV測(cè)試系統(tǒng)的設(shè)計(jì)與實(shí)現(xiàn)　出處：《武漢理工大學(xué)》2015年碩士論文　論文類型：學(xué)位論文

  更多相關(guān)文章： 激光二極管 脈沖LIV 高速大電流脈沖恒流源 高靈敏度脈沖電流測(cè)量

【摘要】：為滿足激光二極管市場(chǎng)低成本和高可靠性的需求,快速準(zhǔn)確的測(cè)試激光二極管參數(shù)成為其生產(chǎn)和使用過(guò)程中的重要環(huán)節(jié)。激光二極管特性參數(shù)通常是采用LIV(光-電流-電壓)測(cè)試系統(tǒng)獲取。傳統(tǒng)的LIV測(cè)試系統(tǒng)采用直流恒流源測(cè)試,測(cè)試過(guò)程中LD會(huì)不斷發(fā)熱,影響其特性曲線的真實(shí)性。為解決這個(gè)問(wèn)題,目前國(guó)外廣泛采用脈沖式LIV測(cè)試系統(tǒng),避免了LD在測(cè)試過(guò)程中的溫升,測(cè)試數(shù)據(jù)可靠性更高。同時(shí)考慮到大功率半導(dǎo)體激光器和光纖激光器的測(cè)試需求,系統(tǒng)要求能輸出大電流。高速大電流脈沖式LIV測(cè)試系統(tǒng)設(shè)計(jì)復(fù)雜,國(guó)內(nèi)的相關(guān)產(chǎn)品大量依靠進(jìn)口,為了降低生產(chǎn)成本,本文提出一種新的解決方案。針對(duì)目前國(guó)內(nèi)脈沖式LIV測(cè)試系統(tǒng)輸出電流小精度低、脈沖寬度大的問(wèn)題,本文將脈沖信號(hào)作為寬帶模擬信號(hào)處理。采用模擬交流恒流源的思路搭建寬帶脈沖恒流源,用改進(jìn)的I-V轉(zhuǎn)換電路實(shí)現(xiàn)高速脈沖光功率測(cè)量。本文重點(diǎn)研究?jī)?nèi)容如下:(1)高速大電流脈沖恒流源需要實(shí)現(xiàn)脈沖寬度、脈沖幅度的可調(diào),如何保證邊沿陡峭和大輸出電流是設(shè)計(jì)關(guān)鍵。系統(tǒng)采用脈沖信號(hào)產(chǎn)生、幅度控制、功率驅(qū)動(dòng)的方式實(shí)現(xiàn)參數(shù)的單獨(dú)控制。采用寬帶壓控增益放大器實(shí)現(xiàn)幅度的連續(xù)可調(diào)。利用硬件反饋與軟件反饋相結(jié)合的恒流控制方式補(bǔ)償增益放大器的非線性,實(shí)現(xiàn)快速高精度電流幅度控制。采用分立器件搭建的AB類MOS推挽電路克服寬帶集成功放輸出功率小的問(wèn)題,實(shí)現(xiàn)高速信號(hào)的功率放大,同時(shí)在其前級(jí)添加高增益運(yùn)放校正幅頻響應(yīng)曲線。(2)高靈敏度電流轉(zhuǎn)換電路需要較高的帶寬和電流增益。系統(tǒng)采用改進(jìn)的跨阻放大器實(shí)現(xiàn)I-V變換,T型電阻網(wǎng)絡(luò)作為反饋電阻,提高電流增益和信號(hào)帶寬。(3)源與測(cè)量間的同步可以大幅度減小數(shù)據(jù)采樣壓力。系統(tǒng)采用脈沖上升沿延時(shí)同步觸發(fā)的方式,利用RC延時(shí)和數(shù)字組合邏輯實(shí)現(xiàn)復(fù)雜的ADC觸發(fā)時(shí)序。在理論分析的基礎(chǔ)上,設(shè)計(jì)實(shí)現(xiàn)了各電路子模塊,并對(duì)關(guān)鍵電路進(jìn)行仿真分析。設(shè)計(jì)完成后繪制了PCB板,對(duì)系統(tǒng)進(jìn)行了調(diào)試和修改,系統(tǒng)實(shí)現(xiàn)了預(yù)期目標(biāo)。本脈沖式LIV測(cè)試系統(tǒng)具有脈沖寬度窄(0.5us)、電流大(5A)的突出特點(diǎn)。
[Abstract]:In order to meet the demand of low cost and high reliability in laser diode market. Rapid and accurate measurement of laser diode parameters has become an important part of its production and application. The characteristic parameters of laser diode are usually used in Liv (opto-current-voltage). The traditional LIV test system adopts DC constant current source test. In order to solve this problem, pulse LIV testing system is widely used in foreign countries to avoid the temperature rise in the process of LD testing. The reliability of the test data is higher. Considering the testing requirements of high power semiconductor laser and fiber laser, the system needs to output large current. The design of high speed and high current pulse LIV test system is complex. In order to reduce the production cost, a new solution is put forward to solve the problems of low output current accuracy and large pulse width of pulse LIV test system in China. In this paper, the pulse signal is used as the broadband analog signal, and the idea of analog AC constant current source is adopted to construct the broadband pulse constant current source. The improved I-V conversion circuit is used to realize the measurement of high speed pulsed optical power. The main contents of this paper are as follows: 1) the pulse width and pulse amplitude of the high speed and large current pulse constant-current source need to be adjusted. How to ensure the edge steepness and large output current is the key of the design. The system adopts pulse signal generation and amplitude control. Single parameter control is realized by power drive. The amplitude of gain amplifier is continuously adjustable by wideband voltage-controlled gain amplifier. The nonlinearity of gain amplifier is compensated by constant current control method which combines hardware feedback with software feedback. . Fast and high precision current amplitude control is realized. AB class MOS push-pull circuit with discrete devices is used to overcome the problem of low output power of wideband integrated power amplifier and to realize high speed signal power amplification. At the same time, high gain operational amplifier correction amplitude-frequency response curve. 2) the high sensitivity current conversion circuit needs high bandwidth and current gain. The system uses an improved transresistance amplifier to realize I-V transform. As the feedback resistor, T resistor network can greatly reduce the data sampling pressure by increasing the synchronization between the current gain and the signal bandwidth. The system adopts the pulse rise edge delay synchronization trigger mode. The complex ADC trigger timing is realized by using RC delay and digital combination logic. Based on the theoretical analysis, the sub-modules of each circuit are designed and implemented. After the design is finished, the PCB board is drawn, and the system is debugged and modified. The system has achieved the expected goal. The pulse LIV testing system has the outstanding characteristics of narrow pulse width of 0.5 usu, large current of 5A).
【學(xué)位授予單位】：武漢理工大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2015
【分類號(hào)】：TP274;TN31

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