本文關(guān)鍵詞：新型激光全息防偽標(biāo)識特性參數(shù)測量研究　出處：《湖北工業(yè)大學(xué)》2015年碩士論文　論文類型：學(xué)位論文

  更多相關(guān)文章： 衍射效率 信噪比 彩虹全息圖 點(diǎn)陣全息圖 全息防偽標(biāo)識

【摘要】：激光全息技術(shù)在防偽領(lǐng)域的應(yīng)用被稱為全息防偽,它被廣泛用于醫(yī)藥、食品、以及機(jī)要證卡、電子產(chǎn)品商標(biāo)以及奢侈品等上的防偽標(biāo)識,由于這樣的防偽標(biāo)識性能穩(wěn)定,且造型精美、不易復(fù)制,因此在防偽行業(yè)中占據(jù)著非常重要的位置。但由于全息生產(chǎn)行業(yè)過于迅猛無序地發(fā)展,很多質(zhì)量參差不齊的全息防偽標(biāo)識被制作出來,使消費(fèi)者很難識別產(chǎn)品的真假,并且也嚴(yán)重威脅了正品生產(chǎn)廠家的生產(chǎn)利益。因此為了充分發(fā)揮全息防偽標(biāo)識的防偽能力,需要對防偽產(chǎn)品的制作質(zhì)量進(jìn)行檢測和把關(guān)。在已有的國家檢測標(biāo)準(zhǔn)中,被用于表征全息防偽標(biāo)識制作質(zhì)量好壞的特性參數(shù)主要是衍射效率和信噪比。起初被廣泛應(yīng)用的全息防偽標(biāo)識是用兩步法制成的彩虹全息圖,GB/T17000-1997((防偽全息產(chǎn)品通用技術(shù)條件》給出了其特性參數(shù)的測量方法,并且已有比較成熟的測量儀器。隨著計(jì)算機(jī)的廣泛應(yīng)用和直寫技術(shù)的發(fā)展,很多新型的全息圖如點(diǎn)陣全息圖和基于SLM產(chǎn)生的面陣全息圖被應(yīng)用于防偽行業(yè)。為了對此類新型標(biāo)識的特性參數(shù)進(jìn)行準(zhǔn)確、簡單、快速的測量,并為以后形成完善的測量儀器打下基礎(chǔ),本文主要做了以下工作:本論文以激光全息防偽標(biāo)識的特性參數(shù)測量研究為主要目的,首先對激光全息防偽技術(shù)的特點(diǎn)和發(fā)展進(jìn)行了介紹,然后通過比較彩虹全息防偽標(biāo)識和新型的點(diǎn)、面陣全息圖的制作原理,分析論證了彩虹全息圖特性參數(shù)測量方法不適用于新型的防偽標(biāo)識。為了能對新型的防偽標(biāo)識特性參數(shù)進(jìn)行精確測量,本論文設(shè)計(jì)了一套集光路、電路及軟件在內(nèi)的系統(tǒng),實(shí)現(xiàn)了光電轉(zhuǎn)換、數(shù)據(jù)采集、A/D轉(zhuǎn)換以及數(shù)據(jù)顯示和存儲等功能。利用設(shè)計(jì)的系統(tǒng)對60枚點(diǎn)、面陣全息防偽標(biāo)識的特性參數(shù)進(jìn)行了測量,入射光強(qiáng)的測量誤差低于0.2%,由于激光器功率不穩(wěn)所帶來的系統(tǒng)測量誤差被減小,測量成本降低,為更加成熟的標(biāo)識特性參數(shù)測量方法和新的國家標(biāo)準(zhǔn)的形成提供了理論和實(shí)踐基礎(chǔ)。
[Abstract]:The application of laser holography technology in the field of anti-counterfeiting is called holographic anti-counterfeiting, it is widely used in medicine, food, as well as confidential card, electronic products trademark and luxury goods. Because this kind of anti-counterfeiting marking has stable performance and exquisite shape, it is difficult to copy, so it occupies a very important position in the anti-counterfeiting industry. However, the holographic production industry is developing too fast and disorderly. Many different quality holographic anti-counterfeiting marks have been made, making it difficult for consumers to identify the true and false products. And also seriously threatened the production interests of genuine manufacturers. So in order to give full play to the anti-counterfeiting ability of holographic marking. The quality of anti-counterfeiting products need to be tested and checked. In the existing national test standards. Diffraction efficiency and signal-to-noise ratio (SNR) are the main characteristic parameters used to characterize the quality of holographic anti-counterfeiting marking. At first the widely used holographic anti-counterfeiting mark is a rainbow hologram made by two-step method. GB / T 17000-1997 (General Technical conditions for Anti-counterfeiting holographic products) the measurement method of its characteristic parameters is given. With the wide application of computer and the development of direct writing technology, there are already relatively mature measuring instruments. Many new holograms, such as dot matrix holograms and plane array holograms based on SLM, are used in anti-counterfeiting industry. And lay a foundation for the formation of a perfect measuring instrument in the future. The main work of this paper is as follows: the main purpose of this paper is to measure the characteristic parameters of laser holographic anti-counterfeiting marking. Firstly, the characteristics and development of laser holographic anti-counterfeiting technology are introduced. Then, by comparing rainbow holographic anti-counterfeiting marking and new points, the principle of making plane array holograms is introduced. It is proved that the method of measuring the characteristic parameters of rainbow hologram is not suitable for the new anti-counterfeiting marking. In order to accurately measure the characteristic parameters of the new anti-counterfeiting mark, this paper designs a set of lumped light path. The system includes circuit and software, which realizes the functions of photoelectric conversion, data acquisition, A- / D conversion, data display and storage, etc. The designed system is used to set up 60 points. The measurement error of incident light intensity is less than 0.2. The system measurement error caused by the instability of laser power is reduced and the measurement cost is reduced. It provides a theoretical and practical basis for more mature measurement methods of marking characteristic parameters and the formation of new national standards.
【學(xué)位授予單位】：湖北工業(yè)大學(xué)
【學(xué)位級別】：碩士
【學(xué)位授予年份】：2015
【分類號】：TN249

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本文編號：1386522