基于電光法珀腔的超快微波光子學(xué)頻率測(cè)量技術(shù)研究
發(fā)布時(shí)間:2019-04-12 20:09
【摘要】:在雷達(dá)和電子戰(zhàn)系統(tǒng)中,頻率測(cè)量被廣泛用于未知信號(hào)的探測(cè)和辨別。相比于傳統(tǒng)的電子學(xué)技術(shù),基于微波光子學(xué)的頻率測(cè)量方法如信道法、功率映射法和掃描法等具有大帶寬、低損耗、免疫電磁干擾等優(yōu)點(diǎn),成為研究的熱點(diǎn),其中微波光子學(xué)掃描法頻率測(cè)量受到最大關(guān)注。但是目前的掃描法頻率測(cè)量依賴于機(jī)械式調(diào)諧、熱調(diào)諧、微波源掃頻或頻移環(huán)等方式進(jìn)行掃描,掃描時(shí)間長(zhǎng)、測(cè)頻速度慢。針對(duì)這一問題,本文將電光法珀腔這一模型引入到到微波光子學(xué)頻率測(cè)量領(lǐng)域,提出了基于電光法珀腔的超快微波光子學(xué)掃描法頻率測(cè)量系統(tǒng),并對(duì)該系統(tǒng)的測(cè)頻性能進(jìn)行了理論分析和實(shí)驗(yàn)研究。本文首先闡述了基于電光法珀腔的頻率測(cè)量系統(tǒng)的工作原理,對(duì)該系統(tǒng)涉及到的基本理論知識(shí)進(jìn)行了詳細(xì)描述,并對(duì)該系統(tǒng)的主要性能參數(shù)及其決定因素進(jìn)行了分析。然后設(shè)計(jì)、制備了該系統(tǒng)的核心器件電光法珀腔并進(jìn)行了性能測(cè)試,測(cè)試結(jié)果表明電光法珀腔的掃描頻率可以達(dá)到1 MHz。最后搭建了基于電光法珀腔的測(cè)頻系統(tǒng)進(jìn)行實(shí)驗(yàn)驗(yàn)證,結(jié)果表明該系統(tǒng)可以實(shí)現(xiàn)頻率測(cè)量,測(cè)頻范圍為3.2 GHz,掃描電壓峰峰值僅為7.0 V,在掃描頻率為0.1 MHz時(shí)系統(tǒng)的測(cè)頻精度為±0.025 GHz,當(dāng)增大掃描頻率時(shí),系統(tǒng)的測(cè)頻精度開始降低,在1.0 MHz時(shí)測(cè)頻精度±0.1 GHz。另外我們提出了利用雙電光法珀腔系統(tǒng)改善單腔系統(tǒng)的測(cè)頻范圍,理論和仿真結(jié)果表明雙腔系統(tǒng)可以在保證精度和速度的同時(shí)將測(cè)頻范圍從3.2 GHz提高到54 GHz。雙腔系統(tǒng)的測(cè)頻精度和測(cè)頻范圍受限于制備工藝導(dǎo)致的損耗,采用更先進(jìn)的工藝系統(tǒng)在這兩個(gè)方面的性能可以進(jìn)一步提高。與現(xiàn)有的其它微波光子學(xué)掃描法頻率測(cè)量系統(tǒng)相比,基于電光法珀腔的頻率測(cè)量系統(tǒng)結(jié)構(gòu)非常簡(jiǎn)單,不需要額外的微波源、泵浦源或是長(zhǎng)光纖,只需要施加峰峰值為7.0 V的掃描電壓就能實(shí)現(xiàn)頻率測(cè)量,對(duì)探測(cè)器的帶寬要求也非常低。具有結(jié)構(gòu)簡(jiǎn)單、成本低廉、低壓操作的優(yōu)點(diǎn),可以用來探測(cè)持續(xù)時(shí)間非常短的信號(hào),具有非常好的應(yīng)用前景。
[Abstract]:In radar and EW systems, frequency measurement is widely used to detect and identify unknown signals. Compared with the traditional electronics technology, the frequency measurement methods based on microwave photonics, such as channel method, power mapping method and scanning method, have many advantages, such as large bandwidth, low loss, immunity to electromagnetic interference, and so on. Among them, the microwave photonics scanning method is the most concerned about the frequency measurement. However, the current scanning methods rely on mechanical tuning, thermal tuning, microwave source sweep or frequency shift loop for scanning. The scanning time is long and the frequency measurement speed is slow. In order to solve this problem, the electro-optic Fabry-Perot cavity model is introduced into the field of microwave photonics frequency measurement, and an ultra-fast microwave photonics scanning frequency measurement system based on electro-optic Fabry-Perot cavity is proposed. The frequency measurement performance of the system is analyzed theoretically and experimentally. In this paper, the working principle of the frequency measurement system based on electro-optic Fabry-Perot cavity is described in detail, the basic theoretical knowledge involved in the system is described in detail, and the main performance parameters and the determining factors of the system are analyzed. Then, the electro-optic Fabry-Perot cavity is fabricated and its performance is tested. The results show that the scanning frequency of the electro-optic Fabry-Perot cavity can reach 1 MHz.. Finally, a frequency measurement system based on electro-optic Fabry-Perot cavity is set up for experimental verification. The results show that the system can realize the frequency measurement, and the frequency measurement range is 3.2 GHz, the peak voltage peak is only 7.0V, When the scanning frequency is 0.1 MHz, the frequency measurement accuracy of the system is 鹵0.025 GHz,. When the scanning frequency is increased, the frequency measurement accuracy of the system begins to decrease, and at 1.0 MHz, the frequency measurement accuracy is 鹵0.1 GHz.. In addition, the frequency measurement range of single cavity system is improved by using double electro-optic Fabry-Perot cavity system. The theoretical and simulation results show that the frequency measurement range can be improved from 3.2 GHz to 54 GHz. while ensuring the accuracy and speed of the dual-cavity system. The precision and range of frequency measurement of the two-cavity system are limited by the loss caused by the fabrication process. The performance of the more advanced process system in these two aspects can be further improved. Compared with other existing microwave photonics scanning frequency measurement systems, the frequency measurement system based on electro-optic cavity is very simple and does not require additional microwave source, pump source or long fiber. The frequency measurement can be achieved only by applying a scanning voltage with a peak of 7.0 V, and the bandwidth of the detector is also very low. It has the advantages of simple structure, low cost and low voltage operation. It can be used to detect the signal with very short duration and has a very good application prospect.
【學(xué)位授予單位】:哈爾濱工業(yè)大學(xué)
【學(xué)位級(jí)別】:碩士
【學(xué)位授予年份】:2016
【分類號(hào)】:TM935.1
,
本文編號(hào):2457353
[Abstract]:In radar and EW systems, frequency measurement is widely used to detect and identify unknown signals. Compared with the traditional electronics technology, the frequency measurement methods based on microwave photonics, such as channel method, power mapping method and scanning method, have many advantages, such as large bandwidth, low loss, immunity to electromagnetic interference, and so on. Among them, the microwave photonics scanning method is the most concerned about the frequency measurement. However, the current scanning methods rely on mechanical tuning, thermal tuning, microwave source sweep or frequency shift loop for scanning. The scanning time is long and the frequency measurement speed is slow. In order to solve this problem, the electro-optic Fabry-Perot cavity model is introduced into the field of microwave photonics frequency measurement, and an ultra-fast microwave photonics scanning frequency measurement system based on electro-optic Fabry-Perot cavity is proposed. The frequency measurement performance of the system is analyzed theoretically and experimentally. In this paper, the working principle of the frequency measurement system based on electro-optic Fabry-Perot cavity is described in detail, the basic theoretical knowledge involved in the system is described in detail, and the main performance parameters and the determining factors of the system are analyzed. Then, the electro-optic Fabry-Perot cavity is fabricated and its performance is tested. The results show that the scanning frequency of the electro-optic Fabry-Perot cavity can reach 1 MHz.. Finally, a frequency measurement system based on electro-optic Fabry-Perot cavity is set up for experimental verification. The results show that the system can realize the frequency measurement, and the frequency measurement range is 3.2 GHz, the peak voltage peak is only 7.0V, When the scanning frequency is 0.1 MHz, the frequency measurement accuracy of the system is 鹵0.025 GHz,. When the scanning frequency is increased, the frequency measurement accuracy of the system begins to decrease, and at 1.0 MHz, the frequency measurement accuracy is 鹵0.1 GHz.. In addition, the frequency measurement range of single cavity system is improved by using double electro-optic Fabry-Perot cavity system. The theoretical and simulation results show that the frequency measurement range can be improved from 3.2 GHz to 54 GHz. while ensuring the accuracy and speed of the dual-cavity system. The precision and range of frequency measurement of the two-cavity system are limited by the loss caused by the fabrication process. The performance of the more advanced process system in these two aspects can be further improved. Compared with other existing microwave photonics scanning frequency measurement systems, the frequency measurement system based on electro-optic cavity is very simple and does not require additional microwave source, pump source or long fiber. The frequency measurement can be achieved only by applying a scanning voltage with a peak of 7.0 V, and the bandwidth of the detector is also very low. It has the advantages of simple structure, low cost and low voltage operation. It can be used to detect the signal with very short duration and has a very good application prospect.
【學(xué)位授予單位】:哈爾濱工業(yè)大學(xué)
【學(xué)位級(jí)別】:碩士
【學(xué)位授予年份】:2016
【分類號(hào)】:TM935.1
,
本文編號(hào):2457353
本文鏈接:http://sikaile.net/kejilunwen/dianlidianqilunwen/2457353.html
最近更新
教材專著