本文選題：π網(wǎng)絡(luò) + 諧振頻率�。� 參考：《核電子學(xué)與探測(cè)技術(shù)》2017年03期

【摘要】：負(fù)載測(cè)試狀態(tài)的晶體元件諧振參數(shù)測(cè)試精度受測(cè)試網(wǎng)絡(luò)參數(shù)影響較大。本項(xiàng)目基于π網(wǎng)絡(luò)零相位法,在測(cè)試系統(tǒng)設(shè)計(jì)中引入補(bǔ)償網(wǎng)絡(luò),減小π網(wǎng)絡(luò)以及測(cè)試插座的雜散阻抗對(duì)測(cè)量結(jié)果的影響。同時(shí),在軟件設(shè)計(jì)方面,對(duì)測(cè)試系統(tǒng)進(jìn)行標(biāo)定,以減小系統(tǒng)誤差。測(cè)量結(jié)果表明,隨晶體的標(biāo)稱頻率的增加,其負(fù)載諧振頻率的相對(duì)方均差呈逐漸增大趨勢(shì)。與目前國(guó)際上較先進(jìn)的250C系統(tǒng)測(cè)量結(jié)果比較,最大測(cè)量偏差小于4×10~(-6)。但是,當(dāng)晶體標(biāo)稱頻率較大(100 MHz)時(shí),系統(tǒng)重復(fù)性測(cè)量精度較差,最大偏差達(dá)10×10~(-6)。
[Abstract]:The measurement accuracy of resonant parameters of crystal elements in load test state is greatly affected by the network parameters. Based on the zero-phase method of 蟺 network, compensation network is introduced in the design of test system to reduce the influence of stray impedance of 蟺 network and test socket on the measurement results. At the same time, in software design, the test system is calibrated to reduce the system error. The results show that the relative mean square difference of the resonant frequency increases with the increase of the nominal frequency of the crystal. Compared with the results of 250C system, the maximum measurement deviation is less than 4 脳 10 ~ (-1) ~ (-6) ~ (-1). However, when the nominal frequency of the crystal is larger than 100 MHz, the repeatability of the system is poor, and the maximum deviation is 10 脳 10 ~ (-6) ~ (-1).
【作者單位】： 湖北工業(yè)大學(xué)理學(xué)院;湖北工業(yè)大學(xué)工程技術(shù)學(xué)院;
【基金】：國(guó)家自然科學(xué)基金(61475044)項(xiàng)目資助
【分類號(hào)】：TM935

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