本文關(guān)鍵詞：多層瓷介電容器長期貯存壽命可靠性研究　出處：《哈爾濱工業(yè)大學(xué)》2016年碩士論文　論文類型：學(xué)位論文

  更多相關(guān)文章： 多層瓷介電容器 長期貯存 貯存壽命 加速退化試驗(yàn) 線性回歸模型

【摘要】：本文分析了多層瓷介電容器的結(jié)構(gòu)、工藝、材料,對(duì)多層瓷介電容器在應(yīng)用中的可靠性隱患進(jìn)行了深入研究,針對(duì)多層瓷介電容器的薄弱環(huán)節(jié)制定了改進(jìn)措施,改進(jìn)后的多層瓷介電容器屬于高可靠產(chǎn)品,只存在與溫度相關(guān)的退化失效模式。本文研究制定了高可靠多層瓷介電容器適用的基于偽失效閾值的加速退化壽命試驗(yàn)方法,利用較短時(shí)間的常溫貯存數(shù)據(jù)確定偽失效閾值,對(duì)退化數(shù)據(jù)運(yùn)用線性退化模型進(jìn)行分析處理,得到了給定偽失效閾值條件下的偽失效壽命預(yù)計(jì)結(jié)果。為驗(yàn)證預(yù)計(jì)結(jié)果的準(zhǔn)確性,采用了威布爾分布的數(shù)據(jù)統(tǒng)計(jì)方法和灰色系統(tǒng)理論模型GM(1,1)分別對(duì)加速退化數(shù)據(jù)和常溫貯存數(shù)據(jù)進(jìn)行了分析,結(jié)果表明本文提出的基于偽失效閾值的加速退化試驗(yàn)方法的壽命預(yù)計(jì)結(jié)果與上述兩種方法一致,因此利用基于偽失效閾值的加速貯存退化試驗(yàn)方法評(píng)價(jià)高可靠多層瓷介電容器的壽命是有效的、可行的。采用基于偽失效閾值的加速退化試驗(yàn)方法可以獲取有限壽命范圍內(nèi)的參數(shù)退化情況,與通常基于失效統(tǒng)計(jì)的加速貯存壽命試驗(yàn)相比,能夠縮短試驗(yàn)時(shí)間,成本更低,更適合工程應(yīng)用。論文的主要內(nèi)容包括以下幾個(gè)方面:(1)針對(duì)多層瓷介電容器的結(jié)構(gòu)特點(diǎn),對(duì)結(jié)構(gòu)的薄弱環(huán)節(jié)進(jìn)行了分析,通過總結(jié)導(dǎo)致多層瓷介電容器失效的原因,提出了工藝過程中的改進(jìn)措施,對(duì)多層瓷介電容器進(jìn)行貯存壽命評(píng)價(jià)的先決條件為多層瓷介電容器已經(jīng)消除了潛在失效模式,即多層瓷介電容器應(yīng)為高可靠產(chǎn)品。(2)根據(jù)高可靠產(chǎn)品失效率低的特點(diǎn),研究制定了基于阿倫尼斯模型的加速退化試驗(yàn)方法,利用常溫貯存數(shù)據(jù)確定了偽失效閾值,對(duì)加速退化試驗(yàn)數(shù)據(jù)進(jìn)行線性回歸處理,得到在給定偽失效閾值的條件下的偽失效壽命預(yù)計(jì)結(jié)果。(3)通過建立反推關(guān)系模型,驗(yàn)證了高溫試驗(yàn)數(shù)據(jù)的準(zhǔn)確性。采用威布爾壽命分布、灰色系統(tǒng)理論模型分別對(duì)高溫加速數(shù)據(jù)和常溫貯存數(shù)據(jù)進(jìn)行分析,得到的壽命預(yù)計(jì)結(jié)果均與本文提出的基于偽失效閾值的加速退化試驗(yàn)方法相一致。
[Abstract]:In this paper, the structure, process and material of multilayer ceramic capacitor are analyzed, and the hidden trouble of reliability in the application of multilayer ceramic capacitor is deeply studied, and the improvement measures are made for the weak link of multilayer ceramic dielectric capacitor. The improved multilayer ceramic dielectric capacitor belongs to a high reliability product. There are only degradation failure modes related to temperature. In this paper, an accelerated degradation life test method based on pseudo failure threshold for high reliability multilayer ceramic dielectric capacitors is developed. The pseudo failure threshold is determined by using the data stored at room temperature for a short time, and the degradation data is analyzed and processed by linear degradation model. The prediction results of pseudo-failure life under the given pseudo-failure threshold are obtained. In order to verify the accuracy of the predicted results, the Weibull distribution data statistics method and the grey system theory model GM(1 are adopted. 1) the accelerated degradation data and the storage data at room temperature are analyzed respectively. The results show that the life prediction results of the proposed accelerated degradation test method based on pseudo-failure threshold are consistent with those of the above two methods. Therefore, it is effective to use the accelerated storage degradation test method based on pseudo failure threshold to evaluate the life of high reliability multilayer ceramic dielectric capacitor. It is feasible to use the accelerated degradation test method based on pseudo failure threshold to obtain the parameter degradation in the limited life range, compared with the accelerated storage life test based on failure statistics. It can shorten the test time, lower cost, more suitable for engineering application. The main contents of this paper include the following aspects: 1) in view of the structural characteristics of multilayer ceramic dielectric capacitor, the weak links of the structure are analyzed. Through summing up the causes of the failure of the multilayer ceramic dielectric capacitor, the improvement measures in the process are put forward. The prerequisite for evaluating the storage life of multilayer ceramic dielectric capacitors is that the potential failure modes have been eliminated. That is, the multilayer ceramic dielectric capacitor should be a high reliability product. (2) according to the characteristics of low failure rate of high reliability products, the accelerated degradation test method based on Arrhenis model was developed. The pseudo failure threshold was determined by using the stored data at room temperature, and the accelerated degradation test data were treated by linear regression. The prediction results of pseudo-failure life under the condition of given pseudo-failure threshold are obtained. The accuracy of high-temperature test data is verified by establishing a model of backstepping relationship. Weibull life distribution is adopted. The theoretical model of grey system is used to analyze the accelerated data at high temperature and storage data at room temperature, and the results of life prediction are in agreement with the accelerated degradation test method based on pseudo-failure threshold proposed in this paper.
【學(xué)位授予單位】：哈爾濱工業(yè)大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2016
【分類號(hào)】：TM53

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