近環(huán)境溫度下材料發(fā)射率測量方法的研究
發(fā)布時間:2018-11-06 08:14
【摘要】:材料發(fā)射率作為反映材料熱輻射特性的一個重要物理量,它可以展示材料輻射能力的強(qiáng)弱。同一種樣品因測試方法的不同,測得的發(fā)射率數(shù)值也不同。由于發(fā)射率是一種比較復(fù)雜的參數(shù),其影響因素的復(fù)雜性帶來了對應(yīng)測量技術(shù)的多樣性。目前,許多測量系統(tǒng)價格昂貴、測量條件要求較高,所以研究一種可應(yīng)用于實(shí)際工程上的發(fā)射率測量方法是十分必要的。本文提出了包含環(huán)境輻射影響的有效輻射、有效亮度溫度和有效光譜發(fā)射率的概念,在此基礎(chǔ)上,針對發(fā)射率測量的需求提出了一種基于紅外測溫儀的發(fā)射率測量新方法,系統(tǒng)主要包括樣品加熱腔、發(fā)射率可調(diào)的紅外測溫儀和表面熱電偶溫度計(jì)。通過調(diào)節(jié)紅外測溫儀的發(fā)射率設(shè)置值,與樣品本身的發(fā)射率進(jìn)行匹配,當(dāng)測量溫度與真實(shí)溫度值相等時,可直接得出樣品的發(fā)射率。利用該系統(tǒng)測量了室溫~200℃下,幾種典型涂料與遠(yuǎn)紅外紡織品樣品8~14μm波段的發(fā)射率,得出其在近環(huán)境溫度下發(fā)射率隨測量溫度的變化情況。搭建了基于能量法發(fā)射率測量系統(tǒng),包括樣品加熱腔、參考黑體、紅外測溫儀。將兩種方法的測量結(jié)果進(jìn)行對比,得到兩種方法測量結(jié)果的符合性較好,同時結(jié)合兩種方法的測量數(shù)據(jù)評價了以上幾種樣品的發(fā)射率性能。本文提出的基于紅外測溫儀的發(fā)射率測量方法具有測量速度快、測量成本低等優(yōu)點(diǎn),并可應(yīng)用于現(xiàn)場的工程測量。
[Abstract]:The emissivity of materials is an important physical quantity reflecting the properties of thermal radiation of materials, and it can show the intensity of radiative ability of materials. The emissivity values of the same sample are different due to the different testing methods. Because emissivity is a kind of complex parameter, the complexity of its influencing factors brings the diversity of corresponding measurement techniques. At present, many measurement systems are expensive and the measuring conditions are very high. Therefore, it is necessary to study a method of emissivity measurement which can be applied to practical engineering. In this paper, the concepts of effective radiation, effective luminance temperature and effective spectral emissivity are proposed, and a new method of emissivity measurement based on infrared thermometer is proposed to meet the needs of emissivity measurement. The system mainly includes sample heating chamber, infrared thermometer with adjustable emissivity and surface thermocouple thermometer. The emissivity of the infrared thermometer is adjusted to match the emissivity of the sample itself. When the measured temperature is equal to the real temperature, the emissivity of the sample can be obtained directly. The emissivity of 814 渭 m band of several typical coatings and far-infrared textile samples at room temperature ~ 200 鈩,
本文編號:2313693
[Abstract]:The emissivity of materials is an important physical quantity reflecting the properties of thermal radiation of materials, and it can show the intensity of radiative ability of materials. The emissivity values of the same sample are different due to the different testing methods. Because emissivity is a kind of complex parameter, the complexity of its influencing factors brings the diversity of corresponding measurement techniques. At present, many measurement systems are expensive and the measuring conditions are very high. Therefore, it is necessary to study a method of emissivity measurement which can be applied to practical engineering. In this paper, the concepts of effective radiation, effective luminance temperature and effective spectral emissivity are proposed, and a new method of emissivity measurement based on infrared thermometer is proposed to meet the needs of emissivity measurement. The system mainly includes sample heating chamber, infrared thermometer with adjustable emissivity and surface thermocouple thermometer. The emissivity of the infrared thermometer is adjusted to match the emissivity of the sample itself. When the measured temperature is equal to the real temperature, the emissivity of the sample can be obtained directly. The emissivity of 814 渭 m band of several typical coatings and far-infrared textile samples at room temperature ~ 200 鈩,
本文編號:2313693
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